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Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production.
In the recent times cryo-electron microscopy has emerged as a very important technique to obtain structural information about these assemblies [6], [7].
From a modest beginning, electron microscopy has emerged as a powerful tool in membrane protein structural determination.
In addition, super-resolution fluorescence microscopy has emerged as a powerful field allowing for ultrastructural insight with up to 10 times higher lateral resolution when compared with confocal microscopy.
Coherent anti-Stokes Raman scattering microscopy has emerged in the past decade as a powerful multiphoton microscopy technique for rapid label-free imaging of organic materials and biological samples with submicrometer spatial resolution in three-dimensions and high chemical specificity.
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Recently, two approaches both based on laser scanning confocal microscopy have emerged to address this need.
Scanning transmission electron microscopy (STEM) has emerged as one of the foremost techniques to analyze materials at atomic resolution.
Scanning ElectroChemical Microscopy (SECM) has emerged as a very attractive method to image living cells activity due to its non invasive character and to the possibility of concomitant electro- and physico-chemical measurements.
Atomic force microscopy (AFM) has emerged as a powerful and multifunctional nanoscale tool, opening exciting new possibilities to address mechanistic questions in cell biology that may facilitate the development of efficient therapies for human health.
Mechanical serial block face scanning electron microscopy (SBFSEM) has emerged as a means of obtaining three dimensional (3D) electron images over volumes much larger than possible by focused ion beam (FIB) serial sectioning and at higher spatial resolution than achievable with conventional X-ray computed tomography (CT).
Piezoresponse force microscopy (PFM) has emerged as one of the most powerful tools for characterizing and manipulating electromechanical responses of piezoelectric and ferroelectric materials at the nanoscale, yet the interpretation and quantitative analysis of PFM data remains difficult and is not well established.
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