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The blue line, red dot line and gray dash-dotted line show the measured resistance values of the electro-conductive yarn.
Most interestingly, the measured resistance values across the edge of the laser spot show an excellent insulation even at the lowest used beam fluence with an increase, with respect to the as-deposited multilayers, of more than 8 orders of magnitude.
B-doped diamond- and PtIr-coated Si cantilevers, with an intermediate spring constant of about 2 N/m, prove to be suitable for our experimental conditions, since measured resistance values are mostly greater than their intrinsic resistances that are estimated at 5-10 and 0.3-1 kΩ, respectively.
The green dots represent the values estimated from the previously reported equation A = 10−11 × R and the measured resistance values.
We fabricated devices with different contact widths (10, 4, 2 μm and 100 nm) and fitted the measured resistance values using 6 to estimate the ρa_ch and ρr_ch (Supporting Information).
We fabricated devices with different contact widths (contact width of 100, 20, 5, and 2 μm) and fitted the measured resistance values using 1 to estimate the rcont and ρch (Supporting Information).
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Changes in the resistance of the flexible IAIA multilayer electrode (IZO (30 nm)/Ag (10 nm)/IZO (40 nm)/Ag (10 nm) sample) were expressed as (R1-R0)/R0, where R0 is the initial resistance and R1 is the measured resistance value after substrate bending.
To start these explorations, we focused on two key electronic routines of measuring resistance values and testing connections, something usually done with a multimeter.
Figure 3 shows the relationship between the measured resistance and carrier concentration values.
Conductivity values were calculated using the measured resistance and measured sample dimensions of the cross section.
The green dots represent the values calculated by the previously reported equation A = 10−11 × R and the measured resistance.
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