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Furthermore, the temperature dependence of the resistivity was measured with comparison of the two-wire and four-wire resistance measurements.
The temperature dependence of the four-wire resistance was successfully measured for the bismuth nanowire, and a difference between the resistivities of the two-wire and four-wire methods was observed.
The two-wire resistance was measured before FIB processing, and the I-V relationship and two- and four-wire resistance were measured after FIB processing.
The wire resistance decreases with both increasing carrier concentrations and wire radius, respectively.
Figure 3 Measured wire resistance versus the wire radius for a IV/III ratio of 0.08 for two different annealing cycles.
The elementary cylindrical sensor is made of platinum wire (resistance thermometer) and isotan wire (heating element) that can operate independently.
The temperature dependence of the resistivity was measured from 4.2 to 300 K at 10 nA, and the two-wire and four-wire resistance measurements were compared.
The resistance measurements of the micro-scale electrodes were performed using an Agilent 4156C parameter analyser after the wire resistance of the measurement equipment was taken into account.
This result indicates that the electrodes on the bismuth nanowire could be successfully fabricated by FIB processing with suitable contacts for four-wire resistance and Hall measurements.
Furthermore, measurement of the temperature dependence of the four-wire resistance was successfully performed for the bismuth nanowire using the fabricated electrodes from 4.2 to 300 K.
Ohmic contact electrodes for four-wire resistance and Hall measurements were fabricated on an individual single-crystal bismuth nanowire encapsulated in a cylindrical quartz template.
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