Sentence examples for window resolution from inspiring English sources

4.09 (Oxford Instruments Ltd., High Wycombe, UK; Si/Li detector, ATW atmospheric thin window, resolution 133 eV for MnK α at 10000 counts).

We applied the Viterbi algorithm to predict the optimal path of transcript tracks per time point with a 10 nt window resolution.

A smaller window value of W = 75 shifts the crossover to below 180 and introduces secondary sign reversals, apparently associated with inadequate sliding window resolution (essentially Fresnel fringes associated with hydropathic waves at the sharp sialic acid edges).

The collected specimens were examined by means of a scanning electron microscope JSM-5800 (JeoLtd.d., Tokyo, Japan) coupled with an energy dispersive X-ray spectrometer (Link ISIS 300, Oxford Instruments Ltd., Si/Li detector, ATW atmospheric thin window, resolution 131 eV for MnK α at 10000 counts) or with an energy dispersive X-ray spectrometer and Inca Energy Software rev.

The default windows resolution is 1920 × 1080, so this was often the case for our videos.

While most modern video cards will add the rotation options to the Windows Screen Resolution window, you may need to open the video card's control panel to access it.

For the current study, we created spectrograms to measure peak frequency at the end and the start of syllables (Fast Fourier transformation (FFT) length 1,024; frame 100%; overlap 75%, Hamming window, frequency resolution 43 Hz, temporal resolution of 5.8 ms) using the Automatic Parameter Measurements setup based on manual delineations of on- and offsets of syllables in oscillograms.

Due to this asymmetrical window, better resolution is obtained.

The system has been implemented on a small-size and low-cost Commercial-Off-The-Shelf (COTS) FPGA/DSP-based board, and features 64 input channels, a maximum counting rate of 45 MHz, and a minimum integration window (time resolution) of 24 μs with a 23 b counting depth.

Forests are complex ecological systems, characterised by multiple-scale structural and dynamical patterns which are not inferable from a system description that spans only a narrow window of resolution; this makes their investigation a difficult task using standard field sampling protocols.

The instrument consists of a measuring head with a Rhodium-target microfocus X-ray tube (30 W, maximum voltage 50 kV, maximum current 0.6 mA), and a 30 mm2 XFlash silicon drift detector (SDD) with beryllium window (energy resolution <145 eV at Mn Ka).