Sentence examples for variation in a process from inspiring English sources

In phase I and after collecting waveform signals, one should study them to: first, understand the type of variation in a process over time to distinguish between the common variation within a profile and the variation between profiles.

Bacteria have been shown to generate constant genetic variation in a process termed phase variation.

As the pattern cannot be resolved directly by the detector pixel size, the analyzer grating G2 is used to sample the intensity variation: In a process called 'phase stepping' (Weitkamp et al., 2005), several images are acquired at different lateral positions of the three gratings relative to one another over one period of the pattern.

Freeing the dichotomized assumption about the stage of hiring would simplify the above typology by reducing the variation in a hiring process and thus does not require additional discussion.

If each factor represents a true latent trait (e.g., variation in a developmental process), it is reasonable to decompose variation in this trait into genetic and environmental components.

However, if reducing variation in a care process or shifting practice patterns is itself the main purpose of the intervention, this should be explicit in the title, abstract, and introduction.

The health-services researcher is therefore likely to conclude that if we measured more variables, we could explain more of this variance, while improvement scientists are more likely to conclude that this unexplained variance is a reflection of common-cause variation in a good process that is under control.

Since variation in process time and process output is commonly accepted to be inevitable for biological processes, application of Process Analytical Technologies PATT) on these processes is challenging.

Common cause variation is the variation exhibited by a process in its usual state, whereas special cause variation is caused by an exceptional or external event.

However, it also operates on the so called off-design conditions due to the variation in a power load, process requirements, or operating mode.

The proposed model can be applied to control wafer-scale material removal rate variations in a CMP process.