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The SEM images were recorded at 20 kV using the secondary electron detector.
SEM characterization was done using the secondary electron mode of SU6600 microscope.
Morphology studies were carried out using a Jeol JSM-5600 Scanning Electron Microscopy (SEM) microscope (using the secondary electron mode).
We observed the morphology and microstructure of silica aerogel samples with scanning electron microscopy (SEM), using the secondary electron detector of a Zeiss Ultra 60 FE-SEM.
All specimens were examined with a scanning electron microscope (JSM-6390LV, JEOL, Tokyo, Japan) using the secondary electron emission mode with accelerating voltages of 1, 5, 10, and 20 kV.
All samples were coated with a 20 nm thick gold layer prior to SEM imaging; the images were acquired using the secondary electron (SE2) mode at 5 kV.
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We present computer simulations of a new design of a variable energy positron lifetime beam that uses for a start signal the secondary electron emission from a 25-nm thick carbon foil (C-foil) located in front of the sample.
Thus, the fluid fraction (water content) of the samples was calculated from the recovered samples by counting the areal fraction of pores in the secondary electron image (SEI) using ImageJ software.
The secondary electron images were taken using a voltage of 5 to 15 kV.
For AES experiment, the Auger microprobe JAMP 9500 F (JEOL), with 3 nm resolution in the secondary electron image mode was used.
The parallel detection of a 20 eV band width of the secondary electron spectrum may be used in the future to attain characteristic material information at low primary electron energies <2 keV.
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