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Using the relation below, the band gap of the thin film ITO layers can be obtained and the results are illustrated in Fig. 3.
According to Heigold et al. (1979), the values of K for a similar formation can be estimated using the relation below; K = 3.86.40R_{text{rw}}^{ -.93283} (3)where ( R_{text{rw}} ) is the resistivity of the aquifer.
Graphene domain length L a can be estimates using the relation below [16, 17]: I_{D } /I_{G } = C lambda )/L_{a } (1 where C = 2.4 × 10−4 and λ is the wavelength of Raman laser, I D and I G are the intensities of the D-band and G-band respectively.
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The capture barrier energy is determined using the relation given below [10].
The anisotropy constant (K α) was estimated according to Stoner-Wohlfarth theory [36] using the relation given below.
Direct carrier capture measurements have also been carried out using filling pulse method [9] at different temperatures using the relation given below.
The variance, skewness and kurtosis of the KwTP distribution can be calculated from (18) using the relations given below.
and using the relation (3.28).
Using the relation, we obtain.
Using the relation, we can write (32).
Since, using the relation (2.4), we have.
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