The ambulance commander was interviewed using the critical decision method.
After the creation of a network graph of technological processes of the incoming train ( {G}_1 ) it is possible to search for a solution using the critical path method.
A typical project-schedule model using the Critical Path Method (CPM) and Program, Evaluation, and Review Technique (PERT) falls short in many practical situations.
The research optimised organisational procedures by using the critical path method (CPM) and introducing electronic data exchange to cut down the whole process by 170 min or 66.7%% of the total time spent at the border station.
After obtaining the controlled stress states at the critical welded joint, the fatigue crack initial life is evaluated by using the critical plane method and the linear cumulative damage theory.
Following an analysis we performed a case study using the critical path method (CPM) for optimisation of the technological process for transport methodology at the Čierna nad Tisou railway station and we proposed a method for electronic data exchange between the rail and customs authorities of Slovakia and Ukraine.
Participants were asked to recall a complex, critical and vivid antibiotic-prescribing incident using the Critical Decision Method (CDM), a type of Cognitive Task Analysis (CTA).
After 15 min, the coverslip was pried off, and the glass slide was immediately immersed in a fixative solution of 2.5% glutaraldehyde in 75 mM cacodylate buffer and dried using the critical point drying method.
Specimens were fixed overnight in 2.5% glutaraldehyde in 0.1 M sodium cacodylate buffer (pH 7.4; Electron Microscopy Sciences, Hatfield, PA, USA) at 4 °C, rinsed three times with PBS, dehydrated in graded ethanol (25, 50, 75, 95, and 100%), and dried using the critical point drying method (BALTEC, Balzers, Liechtenstein).
For scanning electron microscopy (SEM), tissue was dehydrated with an alcohol series and then dried using the critical point drying method, coated with gold and viewed using a Hitachi X650 40 kV scanning electron microscope (Protea Technologies, Johannesburg, South Africa).
