The buffer layer deposition has been optimized by either e-beam or thermal evaporation using respectively ceria or metallic cerium.
Microscopic characterizations were performed by TEM and SEM using respectively on Delong Instruments model LVEM5 and JEOL 646OLV microscopes.
The FTEI, TE, and joint MP BER results are plotted using, respectively, the square, circle, and triangle markers.
At the first step, phrase and accent components are optimized separately, using respectively LFC and HFC as the targets.
Two new multichannel spectral estimation methods are proposed for the postfiltering using, respectively, inner product and joint diagonalization.
We overcome these difficulties using, respectively a splitting scheme, a numerical dispersion relation and absorbing boundary conditions.
The films were chemically and morphologically characterized using respectively X-ray photoemission spectroscopy and atomic force microscopy.
We investigated the films' thickness, morphology, and surface topology using, respectively, profilometry, scanning electron microscopy, and atomic force microscopy.
However, in fact, those nuisance parameters are equivalently removed by using respectively the observations d avg in (13) or the OSP procedure.
Furthermore, the algorithm estimates β and b separately using, respectively, a growth component and a decay component of the four-phase structure.
Columns (e) and (f) show results from the two-stage method LRC/CRF, mapped to pixel level using, respectively, the nearest-patch and oversegmentation methods.
