A high-power impulse magnetron sputter deposition system with feedback control using an optical emission spectrometer (OES) is used to deposit nc-WC/a-C H thinc-WC/a-C Hnc-WC/a-C Hen (W) thinet material reaction with C2H2 gas in a reactive mode.
The figure-of-merit used for performance evaluation was the average power density determined at the LSC edge sheet, measured using an optical fibre connected to a spectrometer.
The intensity of scattered light from these lenses was quantitatively measured using an optical fiber coupled with a spectrometer.
This was achieved by performing fluorescence spectroscopy of the phantoms using an optical fiber coupled with a spectrometer.
The reflectance absorption spectrum was analyzed using an optical fiber vis NIR spectrophotometer (Ocean Optics, USB4000 VIS-NIR spectrometer, QR400-7-UV vis reflection probe).
Unpolarized light from a tungsten-halogen light source was incident normally to the nanochip surface and collected using an optical fiber connected to a built-in miniature spectrometer.
Raman spectra were recorded using an optical microscope with 50× objective attached to a HR800 (Jobin Yvon) spectrometer with an excitation wavelength of 632 nm.
The optical transmission spectra were recorded using a fiber optical spectrometer (USB4000, Ocean Optics) with a spectral resolution of 1 nm.
Hyperspectral images are produced by imaging spectrometers, which use an optical dispersing element (e.g. grating or prism) that splits the light into many wavelength bands, which are then detected using 100 1000 s of detectors (e.g. across a CCD chip).
