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The surface morphology modifications induced by shot peening were evaluated using an optical profilometer.
The roughness and topography was investigated by light scattering spectroscopy using an optical profilometer (Contour GT-K1, Veeco).
The profile of one of the longest released PS microbeams measured using an optical profilometer is shown in Figure 4.
The characterization of the surface is carried out using an optical profilometer and two different species of fibers, as well as their mixture, are used.
The thickness of the PDMS membranes under different spin speeds, spin times, and PDMS concentrations was measured using an optical profilometer.
The plated area was then profiled using an optical profilometer (Wyco NT3300, Veeco Instruments Inc., Woodbury, NY) to find the difference in height between the PDMS film and the substrate.
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The splat flattening ratio and coating crater depth/diameter were measured using a light optical microscope (LOM) and an optical profilometer to evaluate the degrees of particle and coating deformation.
We propose an optical profilometer system for evaluating mirrors that are used for hard X-ray nanofocusing.
With an optical profilometer, designed with a confocal setting of its optics, (CLSP), and an atomic force microscope (AFM) the surface topography of the specimens was investigated at two different resolutions.
Also, permanent deformations after the impact were scanned with an optical profilometer.
We then characterized the surfaces with an optical profilometer, a scanning electron microscope and contact angle measurements.
More suggestions(15)
using an optical rangefinder
using an optical technique
using an optical fiber
using an physical profilometer
using an optical Coherence
using an optical extensometer
using an optical ray
using an noncontact profilometer
using an optical illusion
using an optical attenuator
using an optical network
using an optical chopper
using an optical zoom
using an Dektak profilometer
using an optical spectrometer
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