Sputtered metal thickness was determined using a Stylus Profilometer DEKTAK3 (Veeco, Plainview, NY, USA ) instrument.
On the basis of the analysis results, an effective frequency components field using a stylus type profilometer is clarified, and the selection criteria of the stylus tip radius for measurement is proposed considering the surface texture characteristics of the specimen.
In-situ stress values were calculated using measurements from a Multi-beam Optical Stress Sensor (MOSS) system, while ex-situ stress values were calculated using measurements from a stylus profilometer.
New feature documentation is accomplished with the GPS, or on the touch screen using a stylus.
Writing is produced using a stylus or directly through finger.
They would scratch words into the wax using a stylus.
Data input is much slower and erroneous on smartphones using a stylus [ 117].
The a-Si H films a-Si Hposited by plasma-enhanced CVD in a thickness ofilms nm (±30 nm, meareredepositedylus profilometer) on a Corning 7059 glass subytrate coated with 40-nm-thin nickel film and 10 nm titanium interlayer for improved adhesion to glass.
So, the surface roughness of the all the specimens were evaluated by using SEM and 3D interferometry profilometer machines, which is non-destructive and much faster compared with a stylus profilometer, and with a larger field, needing no sample preparation, compared with AFM [6].
Roughening of the glass was performed by using diamond grinding pads (crisscross surface finish) with different grits, and the measured average surface (measured with a stylus profilometer) roughness was R a = 0.48 μm, which is comparable to the wavelength of the laser of this study.
The thickness of Ti Ag–O films was measured by a stylus profilometer DEKTAK 8 with a resolution of 1 nm.
