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Device performance was measured using a source measure unit (2400, Keithley Instruments, Inc., Cleveland, OH, USA) and a luminance meter (CS100, Konica Minolta Sensing, Inc., Sakai, Osaka, Japan).
A current voltage curve was obtained using a source measure unit (model 2400, Keithley Instruments Inc., Cleveland, OH, USA) under the illumination of a solar simulator with air mass 1.5 global (AM 1.5 G) filters at 100 mW/cm2.
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Conductivity measurements of TiO2 films were measured by using a source meter (Keithley 2400).
The vacuum gauge output was measured by using a source meter (Keithley 2400, Cleveland, OH, USA) and LabVIEW software (National Instruments Corp., Austin, TX, USA). Figure 1 Structure of MWCNT device and FE-SEM image of MWCNT paste after heat treatment.
The I V measurement of the nanowires was obtained using a Keithley Source Measure Unit 236 (Keithley Instruments, Inc).
Electrical properties of the samples were studied using a Keithley Source Measure Unit 236 (Keithley Instruments, Inc., Cleveland, OH, USA) for current-voltage (I-V) measurement.
Current-voltage characteristics were measured using a Keithley Source-Measure Unit 237 (Keithley, Cleveland, OH, USA).
The I-V characteristics of the devices were measured by using a Keithley Source Meter 2612 controlled by a computer.
Our experimental set-up is similar to the one introduced in [ 13, 14] for UMOT which uses a source-locking technique to measure speckle modulation (of frequency as high as 1 MHz) with a slow 50 60 Hz CCD camera.
The current density voltage (J V) characteristics of the photovoltaic devices were measured using a Keithley 2410 source measure unit both in dark and under illumination at 500 nm.
Electrical measurements of individual PEDOT nanowires were carried out using a Keithley 236 source measure unit in a helium gas flow cryostat (Oxford), or a Physical Property Measurement System from Quantum Design and a Keithley 6487 picoammeter/voltage source covering a wide temperature range of 10 300 K.
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