Sentence examples for using a silicon tip from inspiring English sources

The surface morphology was revealed by AFM (Park Systems, XE-70) with a non-contact mode using a silicon tip of curvature less than 10 nm.

To obtain the topographies of the patterned structures, the Al substrates are then scanned by AFM using a silicon tip (RTESP, Bruker Company, Ettlingen, Germany) under the tapping mode.

Images were acquired under AC mode using a silicon tip with a typical resonance frequency of 300 kHz and a radius smaller than 10 nm.

A single cell was first localized using a silicon nitride tip, after which the tip was exchanged with a hydrophobic tip.

AFM investigations were performed using a PSIA XE-100 SPM system operating in tapping mode in air by using a silicon nitride tip (model MLCT-AUHW, Park Scientific) with a cantilever having a spring constant of 0.01 N m−1.

Imaging was performed on a Digital Instruments Dimension 3000 Nanoscope IIIA scanning probe microscope using a silicon RTESP cantilever (tip radius <10 nm) from Veeco Instruments operating in tapping mode.

We present 2D cantilever arrays for parallel AFM and their fabrication process using a silicon nitride cantilever with molded tip as the base element of the array.

The power of the microwave was 1800 W. Figure 5 shows the SKPM images of Si-based Ag NPs acquired using a bare silicon tip (Fig. 5a1, a2), a commercial PtIr-coated silicon tip (Fig. 5b1, b2), a PSM-60 tip (Fig. 5c1, c2), and a PSM-90 tip (Fig. 5d1, d2), respectively.

Mice were anaesthetised with isoflurane and were subjected to 45 minutes MCAo (left side occluded), using a silicon-coated monofilament with a tip diameter of 210 μm (Doccol Corp., Redlands, CA) and perfused transcardially 24 hours after reperfusion.

The analysis proceeds by first developing an analytical model of the emission from a silicon tip using a modified WKB approach to the tunneling current, which is validated by the more exact Airy function approach to solving Schrödinger's equation.

To quantify the surface roughness for the clipped dorsal phase of fingernail plate, Bruker multimode-8 Atomic Force Microscope (AFM) equipped with a silicon tip was used in contact mode.