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Also, parameters in the calculation of RI using a refractive ellipsometer are too large to make adequate calculation of RI.
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Eluted saccharides were measured using a refractive index detector.
Detection was carried out using a refractive index detector.
Peaks were detected using a refractive index detector (RID-10A; Shimadzu, Torrance, CA).
Peak detection was performed using a refractive-index detector.
The refractive index and thickness of the samples were measured using an ellipsometer with refractive index estimated to be 1.61 and thicknesses values being 0.91 μm, 1.36 μm, 3.37 μm and 4.40 μm.
The film refractive index and the film thickness were measured using a null Ellipsometer Gaertner L117 (Gaertner Scientific Co., Chicago, IL, USA) with a laser of He-Ne (632.8 nm); the film thickness was measured using a Dektak 150 profilometer (Veeco Instruments Inc., Plainview, NY, USA).
The optical constant (complex refractive index N=n+ik) of the films on single-crystal silicon has been determined using a scanning ellipsometer.
Protein attachment studies were carried out using a flow cell system, which was monitored using a spectroscopic ellipsometer.
Sample thickness and ellipsometric spectra were measured using a spectroscopic ellipsometer, and the parameters determined by computer simulation matched with the experimental results well.
The thickness and growth rate of ZnO and TiO2 films are obtained using a spectroscopic ellipsometer, indicating the high accuracy of the ALD technique in controlling the growth of nanolaminates.
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