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The spectra have been recorded in an attenuated total reflectance mode using a ZnSe crystal as a sample holder.
The spectra have been recorded in an attenuated total reflectance (ATR) mode using a ZnSe crystal as a sample holder.
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A ZnSe layer (100 nm) was first grown at 250°C using a ZnSe compound source.
The OPO light is split in two beams using a ZnSe wedge.
In experiments, an infrared image of a sample was formed on the distal end of the bundled fiber by using a ZnSe lens.
IR spectra were recorded using a Bruker Tensor 27 instrument with an ATR Micro Focusing MVP-QL instrument with a ZnSe crystal and using OPUS software version 4.0 for analysis.
For all ATR-FTIR measurements, a ZnSe crystal was used as the reflection element, which was cleaned by polishing with diamond paste (1 and 0.25 μm) and additionally rinsed in a reflux system with acetone.
Infrared spectra were recorded with a Bruker Tensor 27 working in ATR Micro Focusing MVP-QL with a ZnSe crystal, and by using OPUS software version 4.0 for analysis.
We present a simple route for ZnSe nanowire growth in the ablation crater on a ZnSe crystal surface.
The infrared spectroscopy investigation was carried out in attenuated total reflectance (ATR) employing a "Continuμm"- Nexus line micro spectrophotometer from ThermoNicolet equipped with a ZnSe crystal.
For a ZnSe crystal, the penetration depth is ~1.6 μm at 1000 cm-1 provided the refractive index of the porous alumina layer in water is ~1.4.
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