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X-ray photoelectron spectroscopy and Fourier-transform infrared spectroscopy were used to characterize surface functional groups.
The concept of the fractal dimension is successfully used to characterize surface roughness growth.
Scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS) were used to characterize surface morphology and mesocrystal structures.
Scanning electron microscopy, Raman spectroscopy and XRD were used to characterize surface morphology, texture and purity of the two diamond films.
Atomic force microscopy, scanning electron microscopy, X-ray diffraction, and a diode discharge device were used to characterize surface morphology, crystalline structure, and secondary electron emission coefficient of the films, respectively.
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In the present work, the FTIR technique is used to characterize surface-modified ZnO nanoparticles.
Selected area electron diffraction (SAED) pattern and lattice image coupled with two-dimensional Fourier transform and inverse transform were used to characterize surfaces, planar defects, and preferred orientation, if any, of the phases.
SPR biosensor detection was used to characterize surfaces to which the previously described native or oligomeric forms of wt rTTR had been covalently bound.
In-situ surface X-ray diffraction is used to characterize the surface oxides on a Pt(111) surface in 0.1 M HClO4.
A variety of reaction mechanisms including adsorption, desorption, and several types of Langmuir-Hinshelwood (LH) reactions are used to characterize the surface processes in the DSMC surface chemistry framework.
The ground surface roughness and topography are commonly used to characterize the surface finishing.
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