An electrochemically etched tungsten tip was used for scanning.
A Piezo scanning system (Physik Instrumente GmbH & Co., Karlsruhe, Germany) was used for scanning the samples.
A Tenor 27 spectrophotometer was used for scanning IR spectroscopy with KBr pellets.
A Tenor-27 FT infrared spectrophotometer (Bruker Optics, Ettlingen, Germany) was used for scanning IR spectrum using KBr pellets.
GSM 6510LV Scanning electron microscope was used for scanning electron microscopy and electron diffraction scattering (SEM/EDS) analysis.
One hundred twenty teeth were used for SBS testing, and six teeth were used for scanning electron microscope (SEM) examination.
A Tenor 27 spectrophotometer (Bruker Optics GmbH, Ettlingen, Germany) was used for scanning IR spectroscopy using KBr pellets.
AFM (Agilent AFM/SPM 5500, Agilent Technologies, Chandler, AZ, USA) was used for scanning the chromosome samples.
A Nicolet Magna-IR 550 spectrometer (Thermo Nicolet, Madison, USA) was used for scanning IR spectroscopy with KBr pellets.
Fig. 5 "Annunciazione": general view of the acquisition system used for scanning the backward area C, and of the canvas tensioning hardware.
CAMAG TLC Scanner 3 was used for scanning at λmax 750 nm and operates in reflection absorbance mode by winCATS software.
