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transmission electron diffraction
noun
A type of electron diffraction in which a beam of electrons is transmitted through a thin layer of sample
Exact(12)
The microstructure of the films was studied by atomic microscopy (AFM) and transmission electron diffraction (TED).
From transmission electron diffraction and energy dispersive microanalytic investigations the existence of amorphous aluminium sulphate could be concluded.
The microstructures of the Cu film were analyzed by transmission electron microscopy and transmission electron diffraction (TEM/TED) and the electrical resistance was measured by a four-point probe.
Four different low-index orientation relationships were found between the Pt and sapphire substrate by electron backscattered diffraction combined with transmission electron diffraction patterns.
Especially, dark-field images and transmission electron diffraction of the TEM were used to study the morphology and the chemical nanostructure of the ZnO/CdSe core-shell nanorods in detail.
CNx films [x ranging between 0 and 0.6, as determined by Auger electron spectroscopy (AES)] have been prepared by dual ion beam sputtering and characterized by several techniques [AES, Rutherford backscattering (RBS), Fourier transform infrared (FT-IR), transmission electron microscopy (TEM), transmission electron diffraction (TED)].
Similar(48)
Selected-area transmission-electron diffraction (SAED) and electron-probe microanalysis (EPMA) also showed that neither the chemical composition nor the atomic ordering of the CuO-1 {001} facets was changed during the catalytic process (SI: Figure S11B,C).
Process kinetics and qualitative properties of the product were studied using laser diffractometry, X-ray diffraction, transmission electron microscopy, electron diffraction, and Raman spectroscopy.
The transient oxidation stage of single crystal (001 NiAl was investigated using scanning electron microscopy, transmission electron microscopy, electron diffraction and high resolution electron microscopy.
Platelet graphite nanofibers have been characterized by scanning electron microscopy, transmission electron microscopy, electron diffraction, X-ray photoemission spectroscopy, and atomic force microscopy.
The structure of the films was characterized using high-resolution transmission electron microscopy, electron diffraction and electron energy-loss spectroscopy.
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