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Simulations based on the mechanisms and data for bulk Cu could not reproduce the measured thin film data.
Potts model simulation of normal grain growth shows the shortest tail, whereas the thin film data showed the longest tail (i.e. closest to log-normal), with an intermediate tail shape in the superalloy.
Using the thin film data of the constituent materials Au and Si, the optical absorption in the effective medium was calculated, and the effects of composite geometry, particle size, and shape distributions were analyzed.
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By varying the value of γ in Equation 10, an exact match to the thin film experimental data should be obtained, and thus, the theoretical model will also be valid for metallic thin films.
The thin film characterization data is used to generate a position axis from the piezo-drive voltage and to correct for variations in the two-photon response at different positions of the temporal focus.
The process for generating the three-dimensional models from the base two-dimensional images was applied to scanning electron micrographs of titanium thin films, the data from which is presented in Figure 2.
Grain size data were taken from four three- and two-dimensional microstructures, including simulated grain growth, thin film and superalloy data sets.
Swanepoel method is employed for spectroscopic determination of optical properties of Cu3N thin film using transmittance data.
The bandgap of the Mn-doped ZnO thin film was calculated data of the transmittance versus wavelength plot.
Zn–Ta B-site ordering was not observed in the Ba(Zn1/3Ta2/3 O3 thin film X-ray diffraction data.
Then the principles of operation and recent advances in thin film transistors, memory for data storage, inorganic and organic light-emitting diodes (OLEDs), organic and inorganic thin film SCs, thermoelectric devices, chemiresistive sensors, mechanical actuators, and shape memory materials (SMMs) will be reviewed, to provide insight for future interdisciplinary research in thin film devices.
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