Sentence examples for thin film analysis from inspiring English sources

This paper describes a time-of-flight (TOF) spectrometer for Heavy-Ion Rutherford Backscattering Spectrometry (HI-RBS) recently installed at IMEC for thin film analysis.

The technique is dedicated for thin film analysis and helps in determining the chemical gradient composition from the surface to the bulk and -if the ablation rate can be estimated - to precise the thickness of the different layers of the nanocomposite materials [29].

This definition is directly analogous to conventional linear ellipsometry for thin film analysis, in which the relative values of the diagonal elements in the Jones matrix describing surface reflection (typically) are determined experimentally.

Because various kinds of defects, including oxygen vacancies, can all act as trapping centers in oxide thin films, analysis of the composition and valence states of elements in ZnO Fe thin films could help to understand the improved RS properties caused by magnetic annealing.

DS research interest have spanned from method development of trace ion analysis, characterization of metal thin film, to analysis of biological macromolecules.

XRR, thickness determination, XPS analysis of Ti3AlC2, Ti3C2T x and Ti3C2T x -IC thin films, XRD analysis of byproducts from etching Ti3AlC2 with NH4HF2, intercalation and deintercalation of Ti3C2T x thin films, optimization of the etching process, EDX mapping of Ti3C2T x, SEM and TEM for Ti3AlC2 and Ti3C2T x thin films, and electrical transport measurements and analysis.

To determine the chemical composition of GDC thin films, XPS analysis was carried out.

All of the BaTiO3 thin film samples for analysis were set as 1 × 1 cm2.

A new TOF telescope has been constructed for thin film and surface analysis.

On the other hand, for sample 1, the thin film X-ray analysis was used to observe the presence of nanocrystallites.

12 out of 14 lipases from fungal, bacterial and animal sources were shown to be able to degrade P 3HB-co-92 mol% 4HB) thin film via densitometric analysis.