For the evaluation of the effects of the surfactant, the sample was inspected by Focused Ion Beam (FIB) microscopy [15] (FEI 200 system delivering 30 keV beam of gallium ions).
Prior to compression, the alignment of the setup with the sample was inspected to ensure pure compression along the nominal loading axis.
After thawing and washing, the sample was inspected by light microscopy for the correct number of parasites.
The issues persist even though 96% of the factories in the sample were inspected well over two years ago, the authors write.
The sample is inspected using optical microscopy in order to identify thin flakes (<10 nm) lying across the aluminum gate, e.g., a flake as in location (I .. Thin flakes were found to exhibit a characteristic yellowish color on the gate region (Al2O3/Al) with a strong contrast to thicker flakes of ~15 25 nm, which appear distinctly blue-colored (cf. locations (II).
As in Mühlbacher's overview [ 23], the field of application and the sample are inspected, although our focus remains on the current state of the research (the last 5 years) and the reporting of methodological aspects in the papers.
The sampler was inspected for possible cross-contamination and cleaned with ambient water for individual sample collection.
After fixed time intervals (4, 24, 72, and 148 h), the samples were inspected visually for any possible cake forming, and size measurements were carried out as mentioned above.
The crystal structure of the samples were inspected by an X'Pert PRO MPD diffractometer system using Cu Kα radiation at 40 kV and 40 mA, running from 3.431° to 61.051° with a speed of 10°/min.
The morphology and structure of the samples were inspected by using a field emission scanning electron microscope (FE-SEM, Hitachi S4800, Tokyo, Japan) at an accelerating voltage of 5 KV.
After critical point drying with liquid CO2 in a vacuum apparatus (Polaron CPD 7501, Quorum Technologies, Newhaven, East Sussex, UK) and coating with gold-palladium (JEE-4C, JEOL Ltd., Tokyo, Japan), the samples were inspected by SEM at 1 KeV (FEI Quanta 200).
