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Exact(8)
The stiffness matrices for the present elements are explicitly expressed and the stresses are taken accurately at the nodal points.
In addition to the EDX profiles of the present elements, also the relative variation of GGI and CGI is qualitatively shown in the graph.
Variation of the intensity of ejected secondary ions of the present elements as a function of sputtering time of primary ion beam characterized by secondary ion mass spectroscopy.
In fact, the accuracy and computational efficiency of predicting stresses in laminates with embedded delaminations make the present elements attractive choices for RZT-based delamination initiation and propagation methodologies available in the literature.
SIMS characterizations of the intensity variations of the ejected secondary ions of the present elements as a function of sputtering time of the primary ion beam exhibit that there is a periodical variation of the intensity of O ion and Ti ion with the sputtering time (Figure 2), while the intensity of C ion exhibits an inverse periodical variation with the sputtering time.
The self-assessed scores overlap for about one third with the calculated phases, which are based on the present elements as indicated by the coordinators themselves.
Similar(52)
Accuracy of the present element is demonstrated by comparisons with the available results.
The present element can handle any kind of cross-sectional unsymmetry due to ply orientation.
The present element formulation for composite beams can be easily extended to composite plates and shells.
The present element has five nodes and ten degrees-of-freedom.
The present element has 3 N + 7 degrees-of-freedom for an N-layer beam.
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