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b Testing structure used to transform linear movement into bending motion.
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Figure 1 Schematic of the flip chip test structure used in this experiment.
Fig. 1 A schematic presentation of gas sensor's test structure used for I V measurements of SnO2.
The flip chip test structure used in this experiment consisted of a carrier and a die structure as shown in Figure 1.
Performance was measured based on a pre, immediate and delayed post test structure using Discourse Completion Tasks (DCTs).
The new multiinput multioutput PPF controller was applied to the test structure using a digital signal processor and its efficacy was verified by experiments.
Next, a number of test structures used to quantify adhesion between micromachined surfaces are reviewed.
The designs of the silicon sensors and of the test structures used to verify the technological parameters, are presented.
The application of these approaches is illustrated on two test structures using the gradient method to solve the resulting optimization problem.
Initial tests for whale shark population structure used a Bayesian-clustering method to look for genetic structure using only genotypic data considering each animal independently, regardless of the population grouping within which they were sampled.
We tested for genetic structure using DNA sequence variation at the mitochondrial COI and 16S loci, AMOVA and distance-based methods.
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