General combining abilities of both lines and testers and specific combining ability (SCA) of line by tester interactions were significant for most traits studied.
Another confounded source of variation is allele-by-tester interactions.
The extent to which line-by-tester interactions contribute to low predictive ability warrants further research.
The interaction between the tester and an implementation under test (IUT) is usually assumed to be synchronous.
However, performing this battery can be time consuming and prone to bias from disturbance, mood and interaction with the tester.
It requires no interaction with a large, expensive tester.
It might suggest the interaction effect of genotype and tester lines.
Reciprocating pin-on-plate wear tester is a standard instrument to assess the interaction of corrosion and wear.
The different origin of the high value alleles for the same QTL region indicates the interaction effect of the genotype and tester lines.
Finally, in the third part, unexpected ESD and Latch-up issues such as premature pMOS triggering, unwarranted stress from the HBM tester relay leading to false HBM evaluation, adjacent signal pins interaction and Latch-up will be presented.
