Sentence examples for test diode from inspiring English sources
He-Ne laser (632.8 nm) belongs to the most common devices used in LLLT, so we decided to test diode laser which produced radiation at 635 nm, comparable to He-Ne laser radiation.
Detectors and test diodes were irradiated with 10 MeV protons.
The 1-MeV neutron equivalent irradiation doses were 1.6×1014 and 8.5×1013 cm−2 for detectors, and up to 5.0×1014 cm−3 for test diodes.
The test diodes were irradiated with X-rays to 72 74 kGy, the surface charge was determined from capaciatance voltage measurements, and reverse breakdown voltage was determined from I V-curves I V-curves
Two designs, one with 9 and one with 14 floating rings were evaluated and applied to simple non-segmented test diodes.
You can still test the diode without the Diode setting.
The design of the wafer contains test structures, diodes, mini-sensors, long and very short strip sensors, real pixel sensors and double metal routing variants.
A right-pointing arrow with a cross through it marks the "diode test," for testing whether one-way electrical circuits are connected.[4].
The data of generation tests of diode-pumped lasers with active elements from lanthanum scandium borates doped with Nd, Er and Yb and cerium gadolinium scandium borates doped with Nd are presented.
Figure 5 Electron (left column) and hole (right column) current densities of Diode test case at (pmb{V_{mathrm{body}}=0.8 mbox { V}}).
Figure 2 illustrates the I-V characteristics of the diode test structures fabricated in carbon-implanted Cz and FZ silicon as well as a separate FZ sample implanted both with carbon and oxygen ions.
