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FormFactor manufactures semiconductor wafer probe cards that test chip performance.
The test chip was fabricated at HPK.
A test chip was designed and fabricated for this study.
The test chip size is 2.3×2 mm2, and the active area is 2.1mm2.
The 45 nanometer test chip was manufactured as a proof of principle.
LSI's tool kits let customers test chip designs, using simulation and digital prototypes.
A test chip is implemented using a 0.18-µm CMOS process.
We present a Globally Asynchronous Locally Synchronous test chip fabricated on a 130nm silicon process.
The test chip features instrumentation amplifier (INA) with chopper modulation at the first stage.
A test chip that implements three different redundant methodologies against single event effects is also described.
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The proposed implementation has been validated in a test-chip using a mature 0.18μm CMOS technology.
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