Sentence examples for temperature instability from inspiring English sources

Operation regimes where the temperature instability takes place are investigated.

Negative Bias Temperature Instability (NBTI) has become a critical reliability concern for nanometer PMOS transistors.

Furthermore, modified F82H is resistant to temperature instability during material production.

With the downscaling of CMOS devices, dynamic variability induced by negative bias temperature instability (NBTI) has become a critical issue.

Moreover, we compare the reliability of the two sensing schemes under negative bias temperature instability (NBTI) of PMOS transistors.

Results of an assessment of the bias temperature instability of CMOS transistors using this type of structure are discussed.

Negative bias temperature instability (NBTI) has become an important reliability concern for nano-scaled complementary metal oxide (CMOS) devices.

Accurate parameters of negative bias temperature instability (NBTI) model are essential to predict the circuit lifetime during circuit design.

Negative bias temperature instability (NBTI) is a serious reliability concern for both analog and digital CMOS VLSI circuits.

Impact of hot carrier effect and negative bias temperature instability on the VCO's phase noise is discussed.

It has applications in gate-level reliability analysis, e.g., Bias Temperature Instability (BTI) induced aging, but also several others.