Applying a voltage to the electrical leads of the stack will cause a displacement of the mechanical sides and a force on the faces that are respectively the sum of displacements and forces of each layer.
Disjoining pressure (sum of double layer, van der Waals, and structural forces) between the interfaces was calculated for each aqueous solution.
X-ray diffraction (XRD) indicated that the combination of the multilayer film produced XRD Bragg peak having basal spacing of 1.09 nm, which was compatible with the sum of one layer GO nanosheets and one layer of PDDA polycations.
A different assembling process took place for the flocculated material; its XRD Bragg peaks had multilayer spacing of 1.49 nm, which was compatible with the sum of one layer GO nanosheets and two layers of PDDA polycations.
The comparison between simulated and measured curves gives the fundamental structure period (a sum of QW layer thicknesses and the separating barrier) of 31.6 nm for sample A and 32.3 nm for sample B confirming that the real QW parameters are indeed close to the nominal ones.
To compute error for layer k separately, only the two boundaries that define a layer are added (offsets) and divided by the sum of the layer area as given by the automatic segmentation (A A ) and the layer area as given by the reference segmentation (A R ), Eq. (13).
To give a better impression of the intensity fluctuations we segmented the layers IS/OS, OS, ETPR and RPE by summing the pixels over an imaging depth of ~12µm around the center of the peak intensity of each layer (except for the OS layer where the gap between the segmented IS/OS and ETPR layers was integrated).
The input layer size equals the sum of the hidden layer size, prefix, stem and suffix counts.
According to the DLVO theory, the total interaction energy (VTot) can be expressed as the sum of electrostatic double layer (VEDL) and Van der Waals interaction energy (VVdW).
In this way, the overall thickness of the investigated structure, which is a sum of all layers, can be estimated.
