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The thickness of the polymer substrates was measured using a Fischer Dualscope MP0R instrument (Sindelfingen, Germany).
The surface roughness of the substrates was measured by a Talysurf profilometer (Taylor-Hobson, Leicester, UK).
The performance of as-fabricated substrates was measured using rhodamine B as a probe.
The adsorption kinetics of cellulosic substrates was measured according to the methods by Tu et al. (2009).
Adhesion of the coatings to the substrates was measured by Rockwell C indentation tests.
The interface binding strength between the ceramic coatings and the metallic substrates was measured by the tensile adhesion test method.
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Some physiochemical characteristics of cultivation substrates were measured.
Absorption spectra of the prepared substrates were measured in the reflection mode.
Nanolaminates with different bilayer thicknesses grown on SiO2/Si substrates were measured on cross sections with TEM.
The microstructure features of CeO2/YSZ/CeO2-buffered Ni-W substrates are measured.
Refractive indices (nTE) of films on silicon substrates were measured with a Prism Coupler.
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