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X-ray diffraction (XRD; X'Pert PRO PHILIPS with Cu Kα radiation, Almelo, The Netherlands) was employed to study the structure of the samples.
The phase structure of the samples was characterized by XRD.
The structure of the samples was analyzed by a JEOL JEM-1230 transmission electron microscope (TEM).
This is an indication of difference in structure of the samples due to difference in treatment.
XRD analysis of samples represented the amorphous structure of the samples.
The crystal structure of the samples was characterized by XRD as presented in Figure 3.
The schematic structure of the samples is shown in Figure 1.
SEM and TEM studies confirmed the nanoporous structure of the samples.
The morphology and structure of the samples were characterized by atomic force microscopy (AFM).
It was used to analyze the crystalline structure of the samples.
The crystallographic structure of the samples is probed by X-ray diffraction.
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