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Sub-nm strain profiling is applied to strained Si and SiGe MOSFET channels.
Our results highlight the value of high-density longitudinal sampling studies with high-resolution strain profiling for studying the establishment and response to perturbation of the infant gut microbiome.
X-ray strain profiling results on a series of samples employing in-situ load cycling are correlated with the crack growth rate (da/dN) providing insight into the da/dN retardation known as the "overload effect".
High-energy synchrotron X-ray diffraction experiments are used to perform local crack plane strain profiling of 4140 steel compact tension specimens fatigued at constant amplitude, subjected to a single overload cycle, then fatigued some more at constant amplitude.
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Flow simulations generated fluid strain profiles for different geometries.
Surface finish affected the shear strain profiles in the specimens.
Strain profiles of all series, except GE4 specimens, were plotted for three strain gauge set-up.
Open image in new window Fig. 15 Strain profiles of GFRP wet dry series.
Open image in new window Fig. 18 Strain profiles for longitudinal steel re-bars in beams.
Figure 9 shows the strain profile in the beam cross-section before and after debonding failure.
Open image in new window Fig. 12 Strain profiles of GFRP control pull-out specimens.
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