Sentence examples for stem probe from inspiring English sources

Fig. 4 STEM simulations of a Pt particle on amorphous carbon, using a 20 mrad STEM probe at 80 kV. a Multislice and b d PRISM image simulations for interpolation factors of (f=5), 10, and 20, respectively.

The practical complication is that rastering the STEM probe at higher speeds causes significant image distortions.

Each STEM probe is computed by multiplying every plane wave subset by the appropriate coefficient and summing all wave subsets.

For each probe, a subset of all plane waves is cut out around the maximum value of the input STEM probe.

Recently, it has been demonstrated that the STEM probe can be used to "push" single impurity atoms through the graphene lattice (Dyck et al. 2017).

It is therefore desirable to develop an electron scattering simulation algorithm that shares the calculation burden between STEM probe positions in a more efficient manner than multislice simulation.

The PRISM method requires two parts to compute the scattering of all STEM probes.

The key insight is that because highly converged STEM probes decay to zero quickly with distance from the probe center position, they can be cropped out of the full S-matrix in a highly accurate Fourier interpolation scheme.

This factor f should be chosen to be large enough so that a square area with a side length of the simulation cell size divided by f can encompass all possible STEM probes after they pass through the cell.

We also note that some authors have used converged scanning transmission electron microscopy (STEM) probes to directly evaluate the aberration coefficients from crystalline samples [26 28], but these methods are not directly applicable to plane wave TEM measurements.

Hybridization-based SNP detection methods such as dynamic allele-specific hybridization, molecular beacons, binary probes, and triple-stem probes offer an alternative for identifying specific target sequences.