Damage variables are introduced for the phenomenological treatment of the state of defects and its implications on the degradation of the stiffness properties.
The green band emission is due to the singly ionized oxygen vacancy in ZnO and is an effect of the recombination of a photogenerated hole with the single ionized charge state of defects [21].
The nature of the traps before and after the emission can be summarised as C 0 → C - + C +, where C 0 is the charge state of the defect when it is filled, C - is defect charge state when it emits a hole, and C + is the carrier (hole in this case) that is emitted by the trap.
The production of NC led the free energy to enhance, which increased the density of point defect, leading to the formation of hypersaturated state of point defect, causing lattice distortions.
The green emission corresponds to the singly occupied oxygen vacancy in ZnO and results from the recombination of a photo-generated hole with the single ionized charge state of this defect.
The green band emission corresponds to the singly ionized oxygen vacancy in ZnO and results from the recombination of a photo-generated hole with the single ionized charge state of this defect.
The lower broad peak around 500 nm is usually considered to be the recombination of a photogenerated hole with the single ionized charged state of the defect in ZnO and could be related to the surface oxygen vacancies of the ZnO because the ZnO nanosheet films have much high surface-to-volume ratios [36].
It suggests that the strain state at the interface between the precipitate and the matrix plays a key role in determining the distribution state of irradiation defects thus affect the irradiation damage behavior significantly.
They are related to the singly ionized oxygen vacancies, and are resulted from the recombination of a photogenerated hole with a singly ionized charge state of specific defects [46, 47]. Figure 4 Room-temperature photoluminescence spectrum of the synthesized ZnO micro/nanotube arrays.
In the undeformed state, none of defects are distributed or generated beneath the indenter.
