Nonlinear adjustments must be specified in the figure legend.
A fixed frequency of 40 kHz and various power ratings specified in the figure legends were employed.
Data are presented as mean ± SD; error bars in figures represent SD and are further specified in the figure legends and text.
A visual inspection of the images in Fig. 5 directly reveal that significant electron beam-induced grain growth and grain reorientation is stimulated, as specified in the figure caption.
Figures 12(a) through 12(h) present the results of image formation and enhancement applying different DEDR-related estimators in the simulated uncertain operational scenario as specified in the figure captions.
The images of Figures 11(a) through 11(h) present the results of image formation and enhancement applying different DEDR-related estimators without model uncertainties as specified in the figure captions.
Figure 11 Complementary ROC curves with constant and random exponentially distributed, for GHz, MHz, sec, GHz, : Note: The values specified in the figure are for the constant hold time case, and values are for the random hold time case.
or ±standard deviation (SD) as specified in the figure legends.
All additions were made to this medium, as specified in the figure legend.
Any variations apart from the above-mentioned conditions are specified in the figure legends.
Data presented are only for multiply repeated staining patterns, and they are specified in the figure captions.
