In this report, we examine in detail the contrast between fragment measurements at large acceptance and small acceptance.
Besides, they can be designed for any acceptance angle, while the traditional ones are limited to small acceptance angles.
With this small acceptance angle the error on the extinction coefficient due to the unavoidable fraction of scattered received power was negligible, and the specific extinction coefficient has been obtained with an error smaller than 0.5%.
It is found that the square CPC (n = 4) has some favorable anomalous behavior, with performance surpassing that of designs with 5 and 6 sides for small acceptance angles.
In the past, the performance of polarizing supermirrors has been limited by their small acceptance angle, which made them less suitable for use at short wavelengths or with highly divergent beams.
In contrast, small acceptance angle transmission spectra contain a better balance of absorption and scattering information.
This can be visualized as the small acceptance region on the surface of a sphere representing the distribution of orientations compared to that of the whole sphere surface.
With this small acceptance angle the error on the extinction coefficient due to the unavoidable fraction of scattered received power was negligible, and the specific extinction coefficient ɛ eil has been obtained with an error smaller than 0.5%.
Most importantly, the spectrum obtained from the smaller acceptance angle contains more scattering-related information (size, refractive index of the particle) and can be readily modeled with the appropriate scattering theory.
As the crystal quality declines as seen in Figs. 1 ▸ and 2 ▸, the 2θB peak begins to become more dominant, which is not captured by scanning along the specular direction if a small divergence, ΔΩ, and small acceptance in the scattered beam, Δ2θ, are used.
Hence a typical intensity profile measurement obtained with a low-divergence incident beam and small acceptance in the scattered beam (Δ2θ) will capture a good proportion of the intensity by scanning along the specular direction with both axes, if the crystal is perfect.
