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Scan is not sufficient because small feature size causes physical failures that are difficult to detect.
Advanced semiconductor devices offer a metrology challenge due to their small feature size, diverse composition and intricate structure.
3D stacked die structure is a promising architecture to realize small feature size and enhance electronic performance.
Extremely small feature size and ultra-low power consumption are the most important features of QCA compared to CMOS.
Improvement in the pattern drawing for small feature size and high precision is necessary for fabrication process.
Quantum-dot cellular automata (QCA) is projected to be a promising nanotechnology due to its extremely small feature size and ultra low power consumption.
Similar(46)
Nanoimprint lithography (NIL) templates are in general costly, especially for large area and small feature sizes.
Ti, GST, and GSBT films were chosen as photoresists to obtain small feature sizes.
The implications of our results for MHD stirring in small feature sizes will be discussed shortly.
Modern Field Programmable Gate Arrays (FPGAs) posses small feature sizes, and have gained popularity in mission-critical systems.
Small feature sizes exhibit strong reflection reduction and low scattering, while large feature sizes show strong scattering and even higher order scattering modes with comparatively parasitic absorption loss.
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