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The crystallite size (coherently diffracting domains) results are given in column 7 of Table 1.
The crystallite size (coherently diffracting domains) results are shown in Figure 3.
The results showed that the crystallite size (coherently diffracting domains), grain size, and surface roughness increase with annealing temperature.
The results show that the crystallite size (coherently diffracting domains) increases with increasing the order of symmetry of the chiral nano-flower.
In order to obtain the crystallite size (coherently diffracting domains) of the samples, we used the Scherrer relation [38] D = kλ B cos θ, Open image in new window (2).
Crystallite size (coherently diffracting domains) D was obtained by applying the Scherrer formula [62] to measure the full width at half maximum (FWHM) of the dominant peak of silver nano-flower films [i.e., Ag(111)].
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The ZnSe thin films with different grain sizes (coherently diffracting domains) have been prepared.
The size of coherently scattering domains (CSD) was calculated using the Scherrer equation [6].
The crystallite size, D (coherently diffracting domains), is obtained using the Scherrer formula [14]: B = kλ D cos θ Open image in new window (1).
The calculated crystallite size D (coherently diffracting domains) obtained from the above procedure is given in column 7 of Table 1.
XRD line profile analysis indicated an exponential decay in the mean size of coherently diffracting γ-Mo2N crystallite domains which in turn develop large compressive strains by increasing the film BN fraction.
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