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Deformation of narrow-strip shot peened samples is examined by considering single indentation effect together with its distribution along a cross sectional line.
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d-2 i-2 Cross-sectional line profiles.
a-1 d-1 Cross-sectiona-1 d-1 profiles.
(a-3)–(c-3) Cross-sectional line profiles.
(a-1) Cross-sectional line profile of the sample surface.
(a-1) and (b-1) Cross-sectional line profiles.
a-2 to d-2 Cross-sectional line profiles of corresponding AFM top-views.
Fig. 7 Displacement profile along a cross-sectional line X-Y shown in Fig. 2b.
Figure 5 Voltage distributions along the central cross-sectional line on the electrode.
(c) and (d) show the cross-sectional line profiles (CLPs) of two areas.
(a-1)–(h-1) Cross-sectional line profiles acquired from the white lines in a h.
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