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The colour of the interior and exterior section of samples were different, where the former was darker than the latter.
Micrographs in the symmetry section of samples show that the grain sizes of the forgings almost coincide with the optimization results.
The cross section of samples and corrosion layers observed by SEM method are shown in Figures 2, 3, 4, 5 and 6.
Fig. 1 HRSEM micrographs showing cross section of samples (a) prior to SiGe SEG growth, (b) poor Si surface clean, (c) good Si surface clean and SiGe growth.
Co-localization of the distinct fluorochromes was analyzed, by excitation of the corresponding fluorochromes in the same section of samples, using a fluorescence microscope (Axioplan 2; Carl Zeiss MicroImaging, Inc).
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Fig. 4 Cross section of sample no.
(d) Cross section of sample shown in (b).
Fig. 2 A Polished section of sample IS_Strýtan_01.
(d) TEM cross section of sample b and (e) EDX mapping of sample b.
Figure 6 represents analysis carried out on cross section of sample HT.50.04.
In addition, SEM and X-ray images in the cross section of sample no.
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CEO of Professional Science Editing for Scientists @ prosciediting.com