Sentence examples for scm technique from inspiring English sources
In a transmitter employing SCM technique in an Intensity Modulation Direct Detection (IM-DD) system, laser source nonlinearity is an important issue of concern.
Simultaneously, a SCM technique is constructively integrated into emission signals.
Open image in new window Fig. 2 Schematic overview for the "standard" SCM technique.
During this new transmission approach, the single-cycle modulation (SCM) technique is organically combined with classical pulse modulation [16].
Originally, the SCM technique is also derived for low-power applications in which each information bit is exactly modulated within one single carrier period [23, 24].
We found identical donor weights when using R, Stata with the original ordering, and Stata with alphabetical ordering of donor countries, in line with the standard SCM technique being well-defined.
It was then possible to drive physical investigations through different approaches, using physical cross-section, Secondary Ion Mass Spectrometry (SIMS) and Scanning Capacitance Microscopy (SCM) techniques.
As we need a very formal representation of the SCM techniques for later use, we provide a rather mathematical translation of the verbal description and R-code given by Abadie et al. (2015).
The specificity of action of mature blood cell extracts on their own progenitor cells was investigated by measuring their effects on the structuredness of the cytoplasmic matrix (SCM) using the technique of fluorescence polarization.
In amount of these techniques, SCM became one of the most useful methods for the capacitance characterization of semiconductor as its non-destructive detection of varies electrical properties with high resolution such as dopant profiling variation [11], silicon p-n junction [12] and carrier injection [13], etc.
Chemical, structural, morphological and micro-/macro-electrical properties of undoped and nitrogen- N- doped diamonitrogen- N- dopedminitrogen- N- dopedelectron spectroscopy, Raman andiamondluminescence spectroscopies, films emission scareing electron microscopy, atomic force microscopy, scanning capacitance microscopy (SCM) andeterminedts technique for I–V characteristics, respectively.
