In situ X-ray scattering measurements simultaneously captured the changes in the inter-ionic aggregate peak and amorphous halo during uniaxial elongation.
Using two scattering geometries simultaneously and measuring separately the refractive index n(T) we can determine the logarithmic derivative ∂lgM′ ω, T /∂lgω = QM and thus are able to characterize unambiguously the dominant fast processes by high precision frequency shift measurements.
In this study, we propose a novel fabrication method to obtain a patterned TiO2 nanoparticulate film combined with an additional scattering layer simultaneously by combinatorial techniques of imprinting and transfer method.
Because the CD data suggested a change in the secondary structure content of Skp1, we decided that it was not appropriate to use multiphase bead modeling by using the scattering data simultaneously from Skp1 and GGFGGn-Skp1.
The measurements were routinely carried out at eight scattering angles simultaneously, with an accumulation time of 1 min, and the q-dependences of the relaxation times were checked continuously.
The proposed method is able to maximize the between-class margin by increasing the between-class scatter distance and reducing the within-class scatter distance simultaneously.
The core of OMMPS is to maximize the between-class margin by increasing the between-class scatter distance and reducing the within-class scatter distance simultaneously.
The aim of OMMPS is to maximize the between-class margin by increasing the between-class scatter distance and reducing the within-class scatter distance simultaneously.
To that end, LDA tries to maximize the inter-class scatter matrix and minimize the intra-class scatter matrix simultaneously.
