Sentence examples for scans of the substrate from inspiring English sources

The catalytic oxidation of hydrogen on the candidate catalysts was further examined during cyclic voltammetric scans of the substrate with a tip close to the substrate.

The FTO thin film was measured at roughly 600 nm thick by tracking the ratio of Sn (FTO) to Si (glass) in an energy-dispersive X-ray spectroscopy (EDX) line scan of the substrate cross section and also directly imaged using the electron backscatter detector.

In a closed-loop laser cladding process, the scanning speed of the substrate is required to produce a clad with desired geometry and quality.

In order to determinate the most influent factors among laser beam diameter, laser power, scanning velocity, preheating temperature of the substrate, scanning overlap and copper grains size, a Plackett and Burman's design of experiments has been used.

The Ф angles of the ZnO films are respectively corrected by the Ф scan of the STO substrates.

At least one minute of air exposure was applied because the scanning of the steel substrates during the obtained OSEE took around one minute.

The new instrument uses an extremely small silicon tip that is rapidly scanned across the surface of the substrate.

Absorbance values between 381 and 402 nm (following pre-screen scans) were measured immediately following addition of the substrate and then continuously for 20 minutes using a Cary 50 Microplate Reader in Nunc 96 well microtitre plates.

Another factor that could affect cell morphology is ligand density, which could not be independently controlled under the experimental conditions that alter fibrin stiffness; however, analysis of scanning electron micrographs (Fig. S1) of the substrate surface does not support this hypothesis.

Because the tip can write each "pixel" in microseconds, it can be scanned across the substrate very rapidly.

The Wyko NT9100 Optical Profile employs coherence scanning interferometry, also known as white-light interferometry, white-light confocal, or vertical scanning interferometry to produce high quality three-dimensional surface maps of the substrate with sub-nanometer vertical resolution.