Sentence examples for scanning probe microscope from inspiring English sources

Atomic force microscopic (AFM) images were taken on a MultiTask AutoProbe CP/MT Scanning Probe Microscope (Veeco Instruments, Woodbury, NY).

scanning probe microscope.

The characterization was conducted on scanning probe microscope (SEIKO, SPI4000N).

AFM images were obtained on a VEECO/diCP2 scanning probe microscope (Plainview, NY, USA).

Atomic force microscopy (AFM) measurements were carried out with MultiMode scanning probe microscope (MM-SPM).

We have implemented an adaptive refinement measuring algorithm in a long-range scanning probe microscope.

AFM images were observed using an SPM-9500J3 scanning probe microscope (Shimadzu Corporation, Kyoto, Japan).

Scanning probe microscope IIIa NanoScope Dimension 3000 (Digital Instruments/Bruker, USA) was used for AFM.

The surface topography and architecture were analyzed using an Innova scanning probe microscope (Bruker, USA).

Conductive AFM characterization was performed using a Dimension D3100 scanning probe microscope.

The AFM was performed using NT-MDT multimode, Russia, controlled by solver scanning probe microscope controller.