Sentence examples for scanning probe capacitance from inspiring English sources

scanning probe capacitance microscopy.

Spreading resistance and scanning probe capacitance microscopy (SCM) were applied to measure local electrical properties.

Conductive AFM and scanning probe capacitance microscopy (SCM) were measured in contact-mode using a Pt-coated Si tip and a diamond-coated Si tip, respectively.

Atomic force microscopy (AFM), conductive AFM and scanning probe capacitance microscopy (SCM) were applied to reveal morphology and local electrical properties.

Scanning probe capacitance microscopy (SCM) was applied to measure the local electrical characteristics; however, the isolated quantum dots could not be resolved due to the large concentration of Fe-related defects.

In this article, we present a scanning probe method based on nanoscale capacitance measurements to determine locally (on 10-100 nm scale) the electron mean free path in pristine and in ion-irradiated graphene with different ion fluences.

In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene.

Charge transport at nanoscale in ultra-scaled semiconductor structures and specifically designed nano-standards is investigated by different scanning probe microscopy (SPM) methods, i.e. scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM).

Electron spectroscopy, ion scattering, and scanning probe microscopy.

Nakayama, T. et al. Development and application of multiple-probe scanning probe microscopes.

Scanning probe microscopies, such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM), were initially developed for imaging surfaces23.