Sentence examples for scanning of sample from inspiring English sources

The scanning of sample surface was performed by electron beam with energy of 15 and 20 kV and a diameter of 5 nm in the secondary electron image regime.

Data acquisition was the actual scanning of sample images with the Cyclone® Plus Storage Phosphor System to create an image file that can be analyzed by the OptiQuant™ Image Analysis Software.

The scanning of samples was performed in trace and retrace to avoid the scan artifacts.

Fig. 8 AFM images and line scans of sample surfaces at different growth temperatures.

Fig. 3 AFM images in amplitudes and line scans of sample surfaces.

Figure 2 shows Ф scans of sample 2 for the Pb(111) diffraction with 2θ ≈ 31.3° and the Si(111) diffraction with 2θ ≈ 28.5°, respectively.

θ-2θ scan, ω-scan and Φ-scan of sample 1 showed in Fig. 1a c, which exhibited a very sharp out-of-plane and in-plane texture with FWHM values were 1.7° and 4.4°, respectively.

AFM images in the area 2 μm × 2 μm and 2 μm line scans of sample surface with In droplets and InN nanodots grown at substrate temperature 350 °C are shown in Fig. 3a, b, respectively.

Three scans of sample and buffer were averaged before subtracting the buffer baseline.

Figure 2 (0002) ω -2 θ scan of samples A and B. IL stands for interlayer.

SERS matrix scans of samples over finite areas were carried out at the central frequency f = 1576 cm−1 to assess reparability, reliability, and sensitiveness of the measurements (Fig. 4b).