Scanning force microscopy.
high-speed scanning force microscopy.
To perform scanning Kelvin probe force microscopic measurements and XPS ones, the Ni/Si structures were fabricated where Ni film was deposited by DC magnetron sputtering method.
The surface morphology of the films was observed using scanning electron microscopy (SEM) on a LEO 1530 Scanning Electron Microscope, and atomic force microscopic (AFM) images for the films were obtained from a Nanoscope IIIa setup.
The surface molecular motion of amorphous polymeric solids has been directly measured by lateral force microscopic (LFM), scanning viscoelasticity microscopic (SVM) and differential X-ray photoelectron spectroscopic (D-XPS) measurements.
The microstructure and morphology of the coatings were studied by X-ray diffraction (XRD), energy-dispersive X-ray spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopic (AFM).
ERGO/SS and Cu2O-Cu(OH 2-ERGO/SS are characterized by scanning electrOH 2-ERGO/SSy, energy dispersive X-rarespecharacterizedomic force microscopic and X-ray diffraction.
Field emission scanning electron microscope (FESEM), energy dispersed X-ray analyzer (EDAX) and atomic force microscopic (AFM) examinations revealed a distinct change in morphology of the deposit due to inclusion of the particles in the matrix.
Atomic force microscopic (AFM) images were taken on a MultiTask AutoProbe CP/MT Scanning Probe Microscope (Veeco Instruments, Woodbury, NY).
Atomic force microscopic (AFM) measurements were performed on an Agilent 5500 atomic force microscope (Santa Clara, CA, USA) operated in tapping mode.
