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X-ray diffraction, scanning electronic microscope, energy-dispersive X-ray spectroscopy and transmission electron microscopy were used to identify the phase formation and morphology of the SiCw.
Scanning electronic microscope (SEM) was used to observe the morphology of the fibers.
Scanning Electronic Microscope (SEM) images further supported the existence of cubic crystals and shuttle-like structures.
Scanning Electronic Microscope (SEM) was employed to inspect the tool wear patterns.
The thickness and morphology of films were observed by scanning electronic microscope (SEM).
The microstructures were identified by X-ray diffraction (XRD) and scanning electronic microscope (SEM).
Scanning electronic microscope was used to determine the diameters and their distributions of the fibers.
And scanning electronic microscope (SEM) was used to help the morphology analysis.
Microstructure of the coatings was examined by optical microscope (OM), scanning electronic microscope (SEM), energy dispersive spectroscopy (EDS) and X-ray diffractometer (XRD).
The characteristics of neodymium and iodine doped TiO2 were evaluated by X-ray diffraction (XRD), UV vis diffuse reflectance spectra, and scanning electronic microscope (SEM).
Scanning electronic microscope was used to observe the surface and cross-section morphologies of the Al2O3-40 wt.%TiO2 coating prepared by using the optimum parameters.
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