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Polytetrafluoroethylene. Scanning electron microscope.
Field effect scanning electron microscope.
Scanning electron microscope (SEM) images were recorded on a HITACHI S-570 scanning electron microscope.
Scanning electron microscope (SEM) images were obtained by a scanning electron microscope (JEOL, JSM-5610LV).
The nanoporous characteristics were illustrated through scanning electron microscope and transmission electron microscope images.
Energy dispersive X-ray spectrum of scanning electron microscope.
Scanning electron microscope equipped with EDX analyzer [20].
Scanning electron microscope image of one pair of electrodes (b).
Selected samples were also analysed by scanning electron microscope (SEM).
Fig. 2 Scanning electron microscope image of silicalite.
These polymers were characterized by 20 kV Scanning electron microscope.
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