Sentence examples for scanning electron detector from inspiring English sources

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scanning electron detector.

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FTIR-RM = Fourier Transform Infrared microspectroscopy in reflectance mode; FWHM = full width at one half the maximum height; qBSE = quantitative backscattered electron; SEM/SDD-EDS = scanning electron microscopy/silicon drift detector energy dispersive X-ray spectrometry; XRD = X-ray diffraction.

Surgically-removed calcinosis specimens were analyzed with fourier transform infrared microspectroscopy in reflectance mode (FTIR-RM) to map their spatial distribution and composition, and with scanning electron microscopy/silicon drift detector energy dispersive X-ray spectrometry (SEM/SDD-EDS) to obtain elemental maps.

Images from scanning electron microscopy with backscattering electron detector and X-ray diffraction spectra confirm the existence of the IPN structure of both types of fibers.

The nanostructure and morphology of the hierarchical flower-like SnO2 were characterized by X-ray diffraction (XRD), energy dispersive X-ray detector (EDX), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) techniques.

The structural, elemental composition and morphology were investigated by X-ray diffraction (XRD), energy-dispersive X-ray detector (EDX), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Brunauer Emmett Teller (BET).

The crystal structures and morphologies of the hierarchical architecture were characterized in detail by means of powder X-ray diffraction (XRD), energy dispersive X-ray detector (EDX), scanning electron microscope (SEM) and transmission electron microscope (TEM).

To confirm the results obtained and further investigate about various paper samples, invasive techniques such as high performance liquid chromatography (HPLC with UV vis detector) analysis, scanning electron microscopy (SEM) and pH measurements have also been used.

The fracture surface of the composites and semi-quantitative composition were analyzed by scanning electron microscopy energy dispersive X-ray detector (SEM-EDX; Hitachi S-4800).

Dyes and metal of the metal-wrapped threads from fifteen Persian velvets and six Indian velvets were analyzed by high performance liquid chromatography with photo diode array detector and by scanning electron microscopy with energy dispersive X-ray spectrometry respectively.

Scanning Electron microscopy coupled with an EDX detector, Micro- Raman spectroscopy and polarized light microscopy have been used as part of a multi technique approach to identify the arsenic sulfide pigment(s) used in the decorative panels of the Japanese tower in Laeken, Belgium.

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